Scanner, Probe, and Sample Preparation

Single crystal silicon substrates are used for TappingMode operation in air. These substrates generally have only one cantilever per substrate, which can be viewed with an optical microscope. Ensure that the substrate is mounted so that the probe tip is facing away from the cantilever holder.

1. Install a etched single crystal silicon tip onto an AFM cantilever holder (see Prepare and Load the Probe Holder for more detailed instructions).
2. Load the cantilever holder with tip onto the scanner tube of the Dimension Icon scanner (see Install the Probe Holder on the SPM Scanner for more detailed instructions).
3. Align the laser using the laser control knobs (see Align the Laser for more detailed instructions).
4. Verify the laser beam is positioned on the back of the cantilever, with a spot visible in the Dimension Icon scanner filter screen and a SUM signalThe sum of all four photodetector quadrants (A+B+C+D); indicates how much laser power is reaching the detector. Reflective cantilevers have a higher SUM signal than non-reflective cantilevers. The first step of aligning the laser is to ensure that there is sufficient SUM signal measured from the detector. of at least 1 V.
5. Adjust the photodetector so that the red dot moves toward the center of the Dimension Icon scanner filter screen using the two photodetector adjustment knobs located on the side of the Dimension Icon scanner (see Adjust the Photodetector).
6. Verify that the red dot is centered and elliptical in shape in the Dimension Icon scanner filter screen.
7. Set the Vertical Deflection to 0 V.

Previous Step:

1. Set Up the Experiment

Next Steps:

3. Locate the Probe Tip
4. Tune the Cantilever
5. Focus Surface
6. Check Initial Scan Parameters
7. Engage and Scan

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